Electrical Characterization of Novel Materials
Understanding material properties (dielectric constant and loss tangent) are crucial in designing next-generation antennas and RF components at millimeter wave (30-300 GHz) and terahertz (>300 GHz) bands.
Our group uses free-space techniques for accurate characterization of thin films in laboratory environment. Among the techniques we use is terahertz (THz) time-domain spectroscopy (TDS). This type of measurement can provide accurate information in a wide frequency range of 200 GHz – 1 THz for a wide range of materials. Our recent work was presented at the International Workshop on Antenna Technologies (iWAT 2016) where we reported complex permittivity measurements for various paraffin films.
© Prof. Nima Ghalichechian's Group
B. Ghassemiparvin and N. Ghalichechian, “Permittivity and Dielectric Loss Measurement of Paraffin for mW and THz Applications,” International Workshop on Antenna Technology (iWAT), Hilton Cocoa Beach, FL, Feb 29- Mar 2, 2016 DOI: 10.1109/IWAT.2016.7434797 (download PDF).
Ghalichechian and K. Sertel, “Permittivity and Loss Characterization of SU-8 Films for mmW and Terahertz Applications,” IEEE Antennas and Propagation Letters, vol.14, pp.723, 726, 2015, http://dx.doi.org/10.1109/LAWP.2014.2380813 (download PDF).